-
imaging of subfield scattering targets." Optics Letters 41(21): 4959-4962, 2016. http://dx.doi.org/10.1364/OL.41.004959 Barnes BM, et al: "Three-dimensional deep sub-wavelength defect detection using l=193
-
characterization (ultrasound, x-ray scattering, IR imaging), and experimental equipment design (CAD, controls (i.e., LabView, Python, Arduino, G-code), image/video processing (i.e., ImageJ). [1] A
-
experimental research experience, design of mechanical parts and assemblies (SolidWorks experience is preferable), experience with developing VI’s in LabVIEW, and experience with image processing (MATLAB
-
preparation, manipulation, and electrical probing in conjunction with electron microscopy (SEM). Such probes not only have proven research utility, but are also used in industrial development and process