193 electronics-engineering-"https:"-"https:"-"https:"-"https:"-"https:"-"https:"-"https:" positions at NIST
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potential use of on-chip electronics to detect and measure melt temperatures, to test potential applications in personalized medicine and real-time diagnostics. Electrical-based detection may even prove
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: https://www.nist.gov/programs-projects/nanoscale-imaging-and-spectroscopy-ir-nir-vis-beyond-diffraction-limit ) and/or applying PTR on specific materials or nano systems with efforts balanced based
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, Materials Science and Engineering Division opportunity location 50.64.21.B6780 Gaithersburg, MD NIST only participates in the February and August reviews. Advisers name email phone Dean M. DeLongchamp
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Roxworthy BJ, Aksyuk VA: Nanomechanical motion transduction with a scalable localized gap plasmon architecture. Nature Communications 7: 13746, 2016. https://dx.doi.org/10.1038/ncomms13746 Brian J. Roxworthy
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. Jaremko, M. Jaremko and D. S. Wishart (2019). "NMR Spectroscopy for Metabolomics Research." Metabolites 9 (7). 3 - https://doi.org/10.6028/NIST.IR.8451 Researchers: Aaron Urbas ( [email protected]
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of mm-wave and microwave components. To develop this program in oxide electronics, a successful applicant will have a solid background in programming (Matlab, Python, or equivalent). Experience with
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name email phone Yaw S Obeng [email protected] 301.975.8093 Description We work in close collaboration with the electronics and ancillary industries on their long-term metrology needs. For example
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Simulation for Performance-Based Seismic Engineering Gaithersburg MD 50.64.61.B6482 NIST Analytical Chemistry of Nanomaterials Gaithersburg MD 50.64.61.B1709 NIST Analytical Mass Spectrometry for Organics
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. Villarrubia [email protected] 301.975.3958 Description Scanning electron microscopy (SEM) is used for metrology of nanometer-scale features in semi-conductor electronics applications and for
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as spin electronics and cancer therapy. These materials are studied using both unpolarized and polarized beam neutron scattering techniques including reflectivity, SANS (small angle neutron scattering