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detection system. We are working on combining this technology with state-of-the-art microfluidics. The systems of interest include but are not limited to electrochemical electrified interfaces, double layers
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RAP opportunity at National Institute of Standards and Technology NIST Direct Measurement of Multiaxial Yield Surfaces Location Material Measurement Laboratory, Materials Science and Engineering
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RAP opportunity at National Institute of Standards and Technology NIST Depth Profiling Using Neutron Beams Location Material Measurement Laboratory, Chemical Sciences Division opportunity
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RAP opportunity at National Institute of Standards and Technology NIST Characterization of Protein-based Allergens Location Material Measurement Laboratory, Biomolecular Measurement Division
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RAP opportunity at National Institute of Standards and Technology NIST First-Principles Modeling of Electronic Structure and Near-Edge X-Ray Spectroscopy Location Material Measurement Laboratory
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RAP opportunity at National Institute of Standards and Technology NIST Chemical Speciation on Heterogeneous Surfaces and Interfaces Location Material Measurement Laboratory, Chemical Sciences
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, the property information demand from industry is much larger than the current rate of experimental data production. Consequently, there is an obvious need for accurate methods that can predict viscosity
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RAP opportunity at National Institute of Standards and Technology NIST Atomic Clocks and Wavelength References on a Chip Location Physical Measurement Laboratory, Time and Frequency Division
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RAP opportunity at National Institute of Standards and Technology NIST In vivo Protein Labeling with Stable Isotopes Location Material Measurement Laboratory, Biomolecular Measurement Division
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RAP opportunity at National Institute of Standards and Technology NIST Advanced X-ray Fundamental Parameters Location Physical Measurement Laboratory, Radiation Physics Division opportunity