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Structure in NanoElectronic Junctions.” Journal of Physical Chemistry C 119: 6687, 2015 Goetz KP, Tsutsumi J, Pookpanratana S, et al: “Polymorphism in the organic charge-transfer complex
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undergo dramatic structural changes under the influence of external stimuli, such as light, electric/magnetic field, temperature, shearing force, or pH values. Compared with the widely studied structure and
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. References Gettings KB, et al: STR Allele Sequence Variation: Current Knowledge and Future Issues. Forensic Science International: Genetics 18: 118-130, 2015 Gettings KB, et al: Sequence variation of 22
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Description Research opportunities are available to develop and advance measurement methods required for current and future semiconductor manufacturing processes. Areas of particular interest include
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, water and food safety, and waste remediation. In spite of the huge potential impact of microbiome science, current measurement capabilities are insufficient and interlaboratory comparability
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RAP opportunity at National Institute of Standards and Technology NIST Enabling Advanced Functionalities in Photonics using Low-Dimensional Semiconductors Location Material Measurement Laboratory, Materials Measurement Science Division opportunity location 50.64.31.B8238 Gaithersburg,...
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devices with controlled flow type and shear rate. Microfluidic rheometry for small-angle x-ray scattering (SAXS) and extensional rheometry for neutron scattering are current interests. key words
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current limitations on material validation, which are linked to limitations on post-process nondestructive evaluation (NDE) with conventional methods. This project seeks to develop innovative methods
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, charge, and lattice degrees of freedom in novel materials are studied by elastic and inelastic neutron scattering techniques. key words Doped antiferromagnet; Geometrical frustration; Magnetic molecules
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structure and the electronic response to external stimuli. We seek to understand nanoscale variations in conductivity by leveraging our existing capabilities in AFM-based microwave impedance microscopy (sMIM