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Nondestructive Evaluation. 6(4): 041005 [3] F.H. Kim , S.M. Robinson, N.N. Klimov, and J.-H.J. Scott (2025), “X-ray computed tomography flaw phantom development: stepper photolithography and deep reactive ion
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comprehensively labeled weakness and vulnerability datasets and multidimensional vulnerability classifications. It also enables the development of new algorithms for code analysis and the use of AI models and
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