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-and-quality-control-materials-metqual-program key words Metabolites; Metabolic pathways; Mass spectrometry; Bioinformatics; Chemometrics; Multivariate statistics; Human health; Precision medicine
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transmitted, and then returned to computational states. In this work, we are exploring the use of point defects in silicon that can be used to generate single photon states and coupled to silicon spin qubits
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the “NIST-on-a-chip” program, we are designing and building chip-scale accelerometers as field-deployable SI-traceable standards. The accelerometers employ a micromechanical structure in conjunction with a
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transport, steel-concrete bond). Qualified applicants with relevant experience in materials science, advanced sensing, structural testing, or numerical simulation are encouraged to apply. key words Concrete
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microscopies and x-ray and neutron diffraction and theoretical work on modeling constitutive behavior. Numerous opportunities exist to interact with industrial partners through established, ongoing research
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NIST only participates in the February and August reviews. This program involves multimodal imaging techniques that use magnetic resonance imaging (MRI) as either a base or as a complimentary
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to perceive latent correlations is critical to successfully integrating the vast amount of existing data, including biochemical pathways and enzymatic substrate specificities, in next-generation computational
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NIST only participates in the February and August reviews. Co-advisor: Dr. Angela Stelson, S-parameters calibration lead. Commercial acoustic spectroscopy is stuck below 300 MHz, which limits our understanding of materials. For communications technology, the lack of acoustic data limits the...
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quality and performance attributes to be produced in a repeatable manner. Current methods for using AI/ML approaches for AM DT often assume a direct correlation between AM input parameters and the relevant
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RAP opportunity at National Institute of Standards and Technology NIST Enabling Advanced Functionalities in Photonics using Low-Dimensional Semiconductors Location Material Measurement Laboratory, Materials Measurement Science Division opportunity location 50.64.31.B8238 Gaithersburg,...