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of the instrument fail or are attacked by an adversary. We would like to address the safety concerns by researching a metrology for establishing digital references [2], safety zones (boundaries), validation methods
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a premier tool for probing atomic dynamics, yet extracting physical insights from experimental data remains a significant computational challenge. Traditional methods—Empirical Force Fields and
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semiconductor manufactures to benchmark commercial and in-house strain measurement methods on industrially relevant samples, as well as developing reference materials to allow users of the techniques to evaluate
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[email protected] 301 975 2547 Description Dynamics in semiconductor and other materials are studied using optical and THz pump-probe methods. Rapid changes in optical properties of materials are measured
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that contributes to reliable manufacturing of the next generation computing devices. Computational imaging methods such as coherent diffractive imaging, Fourier ptychography, structured illumination techniques, and
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informatics developers in the public-private-academic Genome in a Bottle Consortium to develop methods to integrate short-, linked-, and long-read sequencing technologies to form benchmarks for somatic variant
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extractions; mass spectrometry; and capillary electrophoresis. Other forensic-related applications of these techniques to the development of methods and/or standards are encouraged. Keywords Chromatography; Off
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. This research aims to develop the label-free chemical imaging method to investigate the microscopic structure and composition of new biomaterials and smart polymers via collaboration with material scientists and
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, metabolomic and lipidomic approaches. These methods will be foundational to studies of microbiome dynamics and functions. Due to the interdisciplinary nature of this project we are seeking applicants with
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charged particle radiation from nuclear reactions is a powerful tool for elemental analysis and compositional mapping of the first few micrometers from a material surface. Neutron depth profiling (NDP