10 electron-diffraction-"https:" positions at CNRS

  • CNRS | Villeurbanne, Rhône-Alpes | France | 10 days ago

    in image processing, tomographic reconstruction, and associated inverse problems; • Knowledge of crystallography and X-ray or electron diffraction; • Programming skills in Python and MATLAB; • The

  • CNRS | Strasbourg, Alsace | France | 30 days ago

    science, or a related field; • Strong knowledge of thin-film growth techniques (PLD, MBE, or similar methods); • Experience in structural characterization (X-ray diffraction, electron microscopy

  • CNRS | Villeurbanne, Rhône-Alpes | France | 3 days ago

    -vacuum lines, GC–MS, IR and UV–Vis spectrometers, solution- and solid-state NMR spectrometers, electron microscopy facilities, etc.). Where to apply Website https://emploi.cnrs.fr/Offres/CDD/UMR5128-CLECAM

  • CNRS | Villetaneuse, Île-de-France | France | 10 days ago

    synthesis reactor developed as part of the project. The PhD candidate will use a range of characterization techniques, including X-ray diffraction and total X-ray scattering, scanning and transmission

  • CNRS | Grenoble, Rhône-Alpes | France | about 2 months ago

    , chromatography, electron microscopy, X-ray diffraction, etc.). Methodology: • Design and synthesize model substrates to measure the activity of enzyme mimics. • Develop analytical methods to detect and quantify

  • CNRS | Palaiseau, Île-de-France | France | 18 days ago

    will then be possible to characterize the morphology and grain size using electron backscatter diffraction (EBSD) analysis of the sample surface prior to testing, and subsequently to determine the

  • CNRS | United States | about 1 month ago

    ? Not funded by a EU programme Is the Job related to staff position within a Research Infrastructure? No Offer Description The PhD work will be carried out within the EMPRe team ( https://dcm.univ

  • CNRS | La Valbonne, Rhône-Alpes | France | about 1 month ago

    samples, utilizing routine characterization tools such as Scanning Electron Microscopy (SEM), atomic force microscopy, X-Ray Diffraction (XRD), cathodoluminescence(CL) and micro photoluminescence (microPL

  • CNRS | Strasbourg, Alsace | France | about 2 months ago

    .; chemical and/or physical activation, including reduction, etc.); - material characterization (X-ray diffraction, electron microscopy, chemisorption, thermogravimetric analysis, and other techniques

  • CNRS | Nancy, Lorraine | France | about 1 month ago

    of laboratory samples by EPMA to measure the carbon concentration profiles, and by electron microscopies (SEM, TEM) to observe the precipitation and the matrix (martensite, retained austenite

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