3 postdoctoral positions at ARCNL in netherlands

Postdoc: Machine learning for imaging and metrology

methods to image complex wafer metrology targets and to improve the precision of modern methods of alignment and overlay metrology for the semiconductor industry. As a Postdoctoral Researcher, you will play

Postdoc: Efficient generation of EUV light from laser-driven plasma

This experiment-oriented postdoctoral position lies at the interface between fundamental physics and industrial application and supports a fully funded Consolidator Grant from the European Research

Postdoc: Machine learning for imaging and metrology

improve the precision of modern methods of alignment and overlay metrology for the semiconductor industry. As a Postdoctoral Researcher, you will play a pivotal role in our cutting-edge research efforts