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Field
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researcher will also work in collaboration with staff from the ICS's electron microscopy and X-ray diffraction platforms. The IT infrastructure will also include workstations fitted with state-of-the-art
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, and in-situ X-ray diffraction; and evaluates phase transformations and microstructure-property relationships. Analyzes data, prepares reports, publications, presentations, and research deliverables
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partial and total reduction processes of the films, with or without capping layers; • Performing structural and electronic characterization using X-ray diffraction and synchrotron-based experiments, in
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spectroscopy). Knowledge of thin-film and materials characterization techniques such as X-ray diffraction, X-ray photoelectron spectroscopy, atomic force microscopy, and scanning electron microscopy is required
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. The postdoc will analyze the phase and composition of their reaction products using techniques spanning X-ray diffraction, energy dispersive X-ray spectroscopy, electron microscopy, and calorimetry. The postdoc
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. The postdoctoral fellow must be familiar with the standard characterization techniques used in the group (X-ray diffraction, magnetism, EPR, NMR, UV-Vis-NIR, and infrared/Raman spectroscopy). In order to design
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by NMR, UV-Vis, or potentiometric titration. Proficiency in structural characterization by single-crystal and powder X-ray diffraction. Experience with determination of binding constants by NMR, UV-Vos
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substrate preparation, sample mounting and thermal contact, gas purity, growth temperature, and related process conditions. Characterize grown material using techniques such as x-ray diffraction, phase
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. • Systematically optimize substrate preparation, sample mounting and thermal contact, gas purity, growth temperature, and related process conditions. • Characterize grown material using techniques such as x-ray
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metrics such as specific capacity, Coulombic efficiency, rate capability, and cycle life. Perform comprehensive pre- and post-cycling characterization of materials using analytical techniques such as X-ray