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and aspects related to safety and best practices. The candidate will make extensive use of state-of-the-art imaging, spectroscopy (Raman, electron microscopy, infrared, etc.) and scattering methods
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time-of-flight secondary ion mass spectrometry (ToF-SIMS), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Experience in data reduction of big spectroscopy, mass spectrometry, and image
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with complementary techniques such as Kelvin probe force microscopy, scanning microwave impedance microscopy, cathodoluminescence, Raman spectroscopy, and electron microscopy to connect local chemical
Searches related to raman spectroscopy
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