2 information-security Postdoctoral positions at Oak Ridge National Laboratory in material-science
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time-of-flight secondary ion mass spectrometry (ToF-SIMS), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Experience in data reduction of big spectroscopy, mass spectrometry, and image
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data science to develop new methodologies for assessing and improving the quality of components fabricated using advanced manufacturing processes. This position resides in the Manufacturing Systems
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