3 ocean-data-assimilation Postdoctoral positions at Oak Ridge National Laboratory in engineering
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time-of-flight secondary ion mass spectrometry (ToF-SIMS), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Experience in data reduction of big spectroscopy, mass spectrometry, and image
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evolution, phase stress, and defect evolution using advanced data analysis tools. Perform alloy fabrication and processing (e.g., arc melting, heat treatment) and relate processing to performance. Apply
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characterization using advanced analytical tools, such as synchrotron, neutron, and laboratory equipment. Experience in data analytics and modeling tools. Special Requirements: Applicants cannot have received
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