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candidates whose peer-reviewed publications demonstrate direct research experience in all three core areas: Kelvin Probe Force Microscopy (KPFM), preferably quantitative KPFM or FM-KPFM; ferroelectric
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electrochemistry, ferroelectricity and magnetism; magneto-ionics in patterned structures and thin films; atomic force microscopy (including magnetic force microscopy, piezo-response force microscopy, Kelvin probe
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using techniques such as microscopy, profilometry, electrical resistance measurements, adhesion testing, and related quality-control methods. The candidate will contribute to the adaptation
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characterisation tools (Raman, AFM, SEM, TGA, DLS, spectrophotometry, electron microscopy, HPLC, XPS) Good understanding of scientific data plotting and statistical data analysis IT tools (Origin Pro, Graph Pad