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related field. Knowledge: Surface/contact potential, dielectric and polarization measurements, thin-film physics and data analysis. Essential research profile: Applications will be considered only from
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characterisation tools (Raman, AFM, SEM, TGA, DLS, spectrophotometry, electron microscopy, HPLC, XPS) Good understanding of scientific data plotting and statistical data analysis IT tools (Origin Pro, Graph Pad
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(including AFM, PFM); imaging of magnetic domains (MFM); analysis of bit states for probabilistic computing (Shannon entropy, bit error rate, unclonable functions, etc.); analysis of surfaces (XPS); experience
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