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partial and total reduction processes of the films, with or without capping layers; • Performing structural and electronic characterization using X-ray diffraction and synchrotron-based experiments, in
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. The postdoctoral fellow must be familiar with the standard characterization techniques used in the group (X-ray diffraction, magnetism, EPR, NMR, UV-Vis-NIR, and infrared/Raman spectroscopy). In order to design
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solid-state NMR • Electron microscopy (SEM, TEM) • Chromatography (HPLC, SEC) • X-ray diffraction • UV-Visible and IR spectroscopy • Light scattering • Material characterization equipment (DSC, TGA, DVS
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29 Jul 2026 Job Information Organisation/Company CNRS Department Centre de Nanosciences et de Nanotechnologies Research Field Physics Physics » Solid state physics Physics » Surface physics