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learning-assisted computational pipeline for the automated detection of point defects in atomic-resolution scanning transmission electron microscopy (STEM) images. Using monolayer MoS₂ as a model system, the
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, image processing, or optical instrumentation. Fluency in English, both in scientific communication and in the writing of reports and research articles. Workplan and objectives to be achieved
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, with applications ranging from scientific research to medical imaging and marketing analysis. With the ever increasing amount of learning data, these algorithms face computational challenges
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