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morphological, structural, thermal, mechanical and surface properties (e.g., SEM, DSC, contact angle, FTIR and XRD), as well as in the evaluation of their response to ionizing radiation (X-rays). d) Preferential
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. The energetics of these defects will be calculated, including formation energy and the electronic structure of the defects, with analysis in the context of electron beam effects. An extension to this work will be
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, etc.) Whilst some metrological techniques are very robust (quantum Hall effect, Josephson effect) it remains a challenge to produce controlled sources of electrons and phonons that are critical
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