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Are you looking for a challenging project in which you develop fundamental advances in metaphotonics and work with high-tech industry to apply them? In this project we aim to develop nanophotonic
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the manufactured devices. While optical inspection methods have the advantage of being fast and non-destructive, they typically face the challenge that features that are to be resolved are much smaller than
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that are relevant for semiconductor manufacturing and uses tomographic techniques in combination with inverse design and machine learning tools. The aim is to determine the possibilities and limitations of the use
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