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STFP Home sign in | focus RAP opportunity at National Institute of Standards and Technology NIST First-Principle Based Modeling for Advancing 2D Electronics Location Material Measurement
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STFP Home sign in | focus RAP opportunity at National Institute of Standards and Technology NIST Low-Dimensional Materials for Electronics, Photonics, Energy, and Sensors Location Material
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) Semiconductors Electronics Location Physical Measurement Laboratory, Nanoscale Device Characterization Division opportunity location 50.68.03.C0739 Gaithersburg, MD 20899 NIST only participates in the
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[email protected] 301.975.2233 Description Combining organic monolayers with semiconductor surfaces is of interest for many differing applications including molecular electronics, sensors, and bio
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@nist.gov 303.497.4938 Description To perform as intended, modern electronics—transistors, amplifiers, mixers, etc.—must simultaneously control large-amplitude1 electrical signals at up to ten harmonics
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of mm-wave and microwave components. To develop this program in oxide electronics, a successful applicant will have a solid background in programming (Matlab, Python, or equivalent). Experience with
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enable easier and more desirable direct processing of nanotube materials for applications such as printable electronics and photovoltaics. Characterizing the role of the specific dispersant polymers and
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biomanufacturing and personalized medicine. We are developing new electronics techniques that leverage the field effect, and optomechanical interferometric methods for the on-chip measurements of molecular
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metamaterial control of light emission. We are also working on the design and fabrication of prototype nanostructure electronic devices such as FinFETs for applications in high power electronics. We welcome
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. Villarrubia [email protected] 301.975.3958 Description Scanning electron microscopy (SEM) is used for metrology of nanometer-scale features in semi-conductor electronics applications and for