11 parallel-programming-"Intelligent-Systems-Group" Postdoctoral research jobs at NIST
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Optics Systems on a Chip Location Physical Measurement Laboratory, Microsystems and Nanotechnology Division opportunity location 50.68.02.C0526 Gaithersburg, MD 20899 NIST only participates in the
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detection. Recent results from our group have shown that these structures are almost purely radiatively broadened at 9 K. We are soliciting proposals to extend this experimental method to investigate multi
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technique, a successful applicant will have a solid background in programming (Matlab, Python, or equivalent). Experience with any of the following lock-amplifiers, vector network analyzers, resonators is
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highly selective chemical separations. Our group is working on a dual-track project to expand this class of materials, and the successful candidate will contribute to either the computational
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built as the ultimate imaging testbed for the quantitative optical measurement of nanospheres and sub-20 nm wide patterned features. Our working group supports US Semiconductor Manufacturing in
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Carlo, GW, and other advanced techniques are oftentimes needed to correctly describe correlated electronic systems. In recent years, electronic structure methods have been coupled to machine learning
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devices. We are developing integrated fabrication of photonic metasurfaces with trapped ion quantum computing systems, leveraging a veteran Damascene lithography process that facilitates optical
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biological systems. Keywords biotechnology; drug products; neutron scattering; ensemble structures; MD simulations; computation Eligibility citizenship Open to U.S. citizens level Open to Postdoctoral
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theory calculations to uncover the microscopic physics responsible for the observed properties. The results obtained are then used to develop models that can be used to simulate systems with up to
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laser systems for generating ultrafast pulses in the IR through UV; instrumentation for multichannel spectral, spatial, and polarization analyses of generated optical signals; sample characterization