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sample preparation, manipulation, and electrical probing in conjunction with electron microscopy (SEM). Such probes not only have proven research utility, but are also used in industrial development and
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) methodologies and modern machine learning methods (support vector machines, symbolic regression). Various aspects of data processing such as detection of erroneous data (outliers) and data balancing
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Superalloys. J. Phase Equilib. Diffus. 43 , 931–952 (2022). https://doi.org/10.1007/s11669-022-01011-1 Keywords Calphad; Diffusion mechanisms; Multicomponent diffusion; Eligibility citizenship Open to
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: https://www.nist.gov/programs-projects/nanoscale-imaging-and-spectroscopy-ir-nir-vis-beyond-diffraction-limit ) and/or applying PTR on specific materials or nano systems with efforts balanced based
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impedance data over the extremely broad frequency range from several 100 Hz to 100 GHz. The electrical impedance of planar measurement structures can be used to extract intrinsic material quantities
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computation modeling for 3D nanoscale property characterizations. In either mechanical, thermal, or electrical measurements, both in quasi-static and dynamic AFM modes, advanced modeling of the tip-sample