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surface metrology. It is relevant to have experience with analysis techniques such as AFM, WLI, contact-angle, XPS, infrared metrology. You will work in the XUV Optics group at the University of Twente
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relevant to have experience with analysis techniques such as AFM, WLI, contact-angle, XPS, infrared metrology. You will work in the XUV Optics group at the University of Twente, embedded in the MESA
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, semiconductor materials or optoelectronic devices. Experience with materials characterization techniques such as XRD, XPS, SEM, AFM, ellipsometry, Hall measurements or related methods. Experience with solar-cell
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techniques such as XRD, XPS, SEM, AFM, ellipsometry, Hall measurements or related methods. Experience with solar-cell characterization (J-V, EQE, stability testing) is considered an advantage. Excellent
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relevant to have experience with analysis techniques such as AFM, WLI, contact-angle, XPS, infrared metrology. You will work in the XUV Optics group at the University of Twente, embedded in the MESA