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with a broad toolkit: magneto-transport, ferromagnetic resonance and propagating spin-wave spectroscopy, and synchrotron-based scanning transmission X-ray microscopy (STXM) for direct, time-resolved
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characterization using TEM techniques such as scanning transmission electron microscopy, convergent beam electron diffraction, electron energy loss spectroscopy, and geometrical phase analysis Investigation
Searches related to scanning probe microscopy
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