74 scholarship-phd-agent-based-modelling Postdoctoral positions at Oak Ridge National Laboratory
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Computing Methods for Physical Sciences Section in CSED. The MsM group is focused on delivering multiscale, multi-fidelity computational models and systems using algorithms and analytics for materials and
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opportunity by fostering a respectful workplace – in how we treat one another, work together, and measure success. Basic Qualifications: PhD in chemical engineering, chemistry, mechanical engineering, civil
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analytical and modeling approaches to interpret experimental results. Collaborate with internal and external research teams to define and advance research directions. Present research findings and publish
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Requisition Id 16540 Overview: We are seeking a Postdoctoral Research Associate who will develop and apply computational methods based on electronic structure theory and artificial intelligence
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deep learning models using the Oak Ridge Leadership Computing Facility (OLCF) systems. Conduct research with scalable transformer-based foundation models with large volumes of spatiotemporal physical
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respectful workplace – in how we treat one another, work together, and measure success. Basic Qualifications: A PhD degree in material science, chemical engineering, mechanical engineering, polymer chemistry
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Requisition Id 17070 Overview: We are seeking a Postdoctoral Research Associate who will use multiscale modeling and simulation to develop probabilistic lifting frameworks for high-temperature
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CPU and GPU based HPC systems. Exploration of the capabilities of DPU/IPU SmartNICs to support network security isolation, platform level root-of-trust, and secure platform management/partitioning
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, instrumentation, and data acquisition systems; conduct laboratory and field testing; and perform thermodynamic analysis, system modeling, and performance assessments. Analyze and interpret experimental and modeling
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Requisition Id 17107 Overview: We are seeking a postdoctoral researcher focused on the development of in situ interfacial characterization techniques for silicon-based materials and to map