Sort by
Refine Your Search
-
Listed
-
Category
-
Country
-
Program
-
Field
-
as quantum sensors. This approach will pave the way for a new form of quantum near-field microscopy, in which atomic probes replace the macroscopic tips employed in conventional scanning probe
-
characterization using TEM techniques such as scanning transmission electron microscopy, convergent beam electron diffraction, electron energy loss spectroscopy, and geometrical phase analysis Investigation
-
use low-temperature scanning probe microscopy (SPM) to experimentally investigate the nature and properties of correlated electrons in van der Waals (vdW) systems, focusing on topological states in
-
in physics or materials science; - experience in the preparation of solid surfaces (preferably under UHV conditions) and/or in scanning probe microscopy techniques; - a strong publication record
-
conditions. These materials will subsequently be studied using STM (to analyze growth) and ESR-STM (to investigate magnetic properties). In recent years, spin-dependent scanning tunneling microscopy (SP-STM
-
microscope (SEM), electron probe microanalysis (EPMA), Raman microspectroscopy, transmission electron microscopy (TEM), laser ablation – inductively coupled plasma mass spectrometry (LA-ICP-MS) and X-ray micro
-
operando characterizations of solid-solid (S-S) and solid-liquid (S-L) interfaces using probe corrected scanning transmission electron microscope (STEM) and related spectroscopy techniques. Processes at Na
-
-throughput characterization methods include spectroscopy, optical and scanned probe microscopy, scattering, reflectivity, ellipsometry, and contact angle measurements. See http://www.nist.gov/mml/polymers
-
University of British Columbia | Northern British Columbia Fort Nelson, British Columbia | Canada | 2 months ago
microscopy and spectroscopy of materials. As a Research Associate, you will support collaborative and interdisciplinary efforts in using sophisticated electron microscopy and spectroscopy techniques to probe
-
tomography and lightsheet microscopy modules; Prototype components using 3D printing; Develop advanced illumination and detection strategies to reduce scattering effects; Accelerate scans and automate image