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advanced research activities including e-beam and UV lithography, PVD, CVD, RIE/DRIE, wet etch, 3D microprinting, and metrology. Working Conditions Work performed primarily in a cleanroom environment
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agents, and active neural cells. The developed metrology is based on state-of-the-art broadband AFM near field imaging systems with modifications allowing nanoscale measurement and control
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&T) • Inspection and Measurement • Metrology and Metallurgy for the Machine Trades • Manual Machining Experience • Computer Numerical Control (CNC) Machine Operation and Programming • Lean
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metrology. Leveraging state-of-the-art microfabrication capabilities, we are combining micro- and nano-mechanics with photonics and plasmonics to develop novel types of probes and modalities of nanoscale