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integrating AI with vision at the edge. Despite recent advancements, the synergy between AI and computer vision remains constrained by fundamental imaging bottlenecks. Conventional HDR techniques frequently
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process data locally while ensuring efficient and scalable artificial intelligence at the edge. TinyML and Edge AI have demonstrated the feasibility of embedding machine learning models on such devices
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nanocrystals, hybrid perovskites and 2D materials. Development of new data-driven approaches for studies of optoelectronic properties using EM, including machine learning / machine vision algorithms. The balance
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creating a process planning ontology that links machines, fixtures, parameters and constraints to support future automated planning and Digital Product Passport requirements. Using IIoT-enabled tracking and