Localization Microscopy

NIST, United States

Updated: 9 days ago
Location: Gaithersburg, MARYLAND
Deadline: The position may have been removed or expired!

NIST only participates in the February and August reviews.


Summary:

Localization microscopy has left the resolution limit in the rearview optics. However, most localization measurements are precise but inaccurate, leading to overconfidence in position data.This fundamental issue is becoming more important as localization microscopy matures, requiring not only novel methods but also reliable quantities for meaningful comparison. We lead the development of innovative standards and novel calibrations to achieve accuracy in localization microscopy [1, 2], with applications ranging from nanoplastic characterization to nanophotonic integration. Our project is collaborative and interdisciplinary, and we seek outstanding applicants with high motivation and strong backgrounds in the physical sciences.

Contact:

Thank you for your interest in this research opportunity. For more information, please email [email protected].

References:

[1] Accurate localization microscopy by intrinsic aberration calibration, C. R. Copeland, C. D. McGray, B. Robert Ilic, J. Geist, and S. M. Stavis, Nature Communications 12, 3925 (2021).

[2] Subnanometer localization accuracy in widefield optical microscopy, C. R. Copeland, J. Geist, C. D. McGray, V. A. Aksyuk, J. A. Liddle, B. R. Ilic, and S. M. Stavis, Light: Science & Applications 7, 31 (2018).


Accuracy; Calibration; Correlative; Localization; Microscopy; Optical; Precision; Standard; Tracking

Citizenship:  Open to U.S. citizens


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