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NIST only participates in the February and August reviews. The Alternative Computing Group at NIST has an ongoing program developing new metrologies to support emerging information processing
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systems will enable a wide range of sensing applications, including chip-scale optical atomic clocks, accelerometers, gravimeters, magnetometers, and electric field imagers to support GPS-free positioning
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patterning. Techniques such as quantitative fluorescence microscopy, time lapse imaging, image analysis, gene reporter cell lines, and flow cytometry will be used to monitor culture heterogeneity, consistency
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are seeking researchers to contribute to the development and application of advanced measurement and automation techniques for exploring processing-structure-property-performance (PSPP) relationships in
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on the design and fabrication of prototype nanostructure electronic devices such as FinFETs for applications in high power electronics. We welcome proposals aimed at new technological aspects of semiconductor
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inertial navigation, medical imaging, and all-optical sensor networks. We are also interested in integrated cavity optomechanical devices that have sufficiently low optical and mechanical loss
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laboratory is equipped with both a conventional atom probe tomograph as well as a prototype EUV-modified atom probe tool. Furthmore, our collaborative laboratory structure provides critical in-house support
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are developing object-oriented computational tools for the analysis of materials with complex microstructures. Starting from a digitized micrograph, the program identifies features in the image, assigns material
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are conducted throughout the manufacturing process of cell-based products and also serve as release criteria. Unfortunately, common measures of cell viability including dye-exclusion, often do not correlate
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of measurements and simulations is increasingly used to improve the understanding of mechanical testing results and provides a means to advance the mechanical testing paradigm toward fewer, more complex tests that