85 high-performance-computing Fellowship positions at SINGAPORE INSTITUTE OF TECHNOLOGY (SIT) in computer-science
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integrating a multimodal detection pipeline, ensuring real-time performance, scalability, and deployment readiness in alignment with the project’s research objectives. The successful candidate will work with a
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academic record plus a high degree of proficiency and motivation for selected research area Have been accepted or have applied for a postdoctoral training at a leading overseas university in a research area
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10 Jul 2026 Job Information Organisation/Company SINGAPORE INSTITUTE OF TECHNOLOGY (SIT) Research Field Computer science Engineering Engineering Researcher Profile Recognised Researcher (R2) First
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benchmarking of inference speed, compute efficiency, and scalability with concurrent agents. Maintain high software engineering standards through rigorous testing, version control, clear documentation, and
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Regulations. Work independently, as well as within a team, to ensure proper operation and maintenance of equipment. Job Requirements A good degree in Computer Science / Engineering, preferably with a relevant
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Researcher (R1) Application Deadline 22 Aug 2026 - 00:00 (UTC) Country Singapore Type of Contract Other Job Status Full-time Is the job funded through the EU Research Framework Programme? Not funded by a EU
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quantum key distribution (QKD) protocols, networks and systems. Able to perform resource placement optimization in computer/communication networks. Proficient in technical writing and analytical skills
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21 Jul 2026 Job Information Organisation/Company SINGAPORE INSTITUTE OF TECHNOLOGY (SIT) Research Field Computer science Engineering Engineering Researcher Profile Recognised Researcher (R2) First
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academic record plus a high degree of proficiency and motivation for selected research area Have been accepted or have applied for a postdoctoral training at a leading overseas university in a research area
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design optimisation, and performance evaluation. Perform advanced materials characterisation and microstructural analysis, including but not limited to: i. X-ray Fluorescence (XRF) ii. X-ray Diffraction