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Location ESTEC, Noordwijk, Netherlands Our team and mission The Radiation and Component Reliability Section (TEC-EDR) and the Microelectronics Section (TEC-EDM) are part of the Avionics and EEE
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the associated levels of assurance, verification and acceptance criteria; developing hazard analysis methodologies tailored to AI-based systems, extending traditional approaches, such as FMEA and FTA, to address
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analysis. Actively pursue personal scientific research, using facilities within ESA centres and those accessed through partnerships with external organisations. Participate in relevant scientific
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