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, ellipsometry, and related techniques. Prepare and characterize chiral molecular assemblies and substrates, including DNA-based and other biomolecular chiral systems where relevant. Author peer-reviewed
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fluent in English. The following work or research experience will be an advantage: experience with cementitious materials, XRD with Rietveld analysis, SEM, TG, DSC, micro-CT, particle size analysis
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knowledge of building materials and be fluent in English. The following work or research experience will be an advantage: experience with cementitious materials, XRD with Rietveld analysis, SEM, TG, DSC
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metallurgy, materials characterization, fracture mechanics, mechanical behaviour of materials, or a related field. Experience with one or more advanced characterization techniques such as SEM, EBSD, TEM, XRD
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conditions, avoiding any air exposure prior to ions or plasma. A series of surface science and plasma techniques, including X-ray Photoelectron Spectroscopy (XPS), in-situ Spectroscopic Ellipsometry, gas-phase
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or more advanced characterization techniques such as SEM, EBSD, TEM, XRD, SIMS or related methods is highly desirable. Experience with mechanical testing, fracture mechanics, hydrogen embrittlement research
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Warsaw University of Technology/Centre for Advanced Materials and Technologies, CEZAMAT | Poland | about 2 months ago
, lithography, plasma deposition, and thermal processes Development and execution of inter-process inspections, including scanning electron microscopy, optical microscopy, atomic force microscopy, ellipsometry
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, and interface-related energy losses Fabricate and evaluate complete single-junction and, where relevant, semi-transparent perovskite subcells using PL/PL mapping, XRD, current–voltage measurements, EQE
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PhD in Optical Characterization and Photonic Performance Analysis of Liquid Crystal Polymer Coatings
; measure angle-dependent reflection, transmission, haze, scattering, polarization selectivity, and spectral bandwidth; perform UV-Vis-NIR spectroscopy, polarized optical microscopy, ellipsometry, Mueller
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articles, conference contributions, book chapters). Particular consideration will be given to expertise in characterization techniques such as Electron Microscopy, UV-Vis Spectroscopy, XRD, FTIR, Zeta