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. Investigating the etching mechanisms and selectivity of InP and InGaAlAs films as a function of plasma parameters using ellipsometry, XPS and AFM. 2. Developing an etching process for the multilayer stack meeting
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, AFM, ellipsometry, or TEM will be considered an asset. The successful candidate should also demonstrate: - strong experimental skills; - the ability to independently design and conduct experiments
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metrology, ellipsometry, or related surface-analysis methods. You are interested in connecting experimental results to physical models and quantitative data analysis. You enjoy hands-on experimental work and
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National Aeronautics and Space Administration (NASA) | Pasadena, California | United States | 19 days ago
candidate with strong cleanroom fabrication tool experience, particularly in materials characterization methods such as ellipsometry, AFM, SEM, TEM, XRD, SIMS, or related techniques. Experience with
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interfaces in Li-ion rechargeable batteries. These techniques include optical in situ characterization methods such as, Raman, FTIR spectroscopy/microscopy, ellipsometry, TERS, near-field nano-FTIR techniques
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, semiconductor materials or optoelectronic devices. Experience with materials characterization techniques such as XRD, XPS, SEM, AFM, ellipsometry, Hall measurements or related methods. Experience with solar-cell
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techniques such as XRD, XPS, SEM, AFM, ellipsometry, Hall measurements or related methods. Experience with solar-cell characterization (J-V, EQE, stability testing) is considered an advantage. Excellent
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National Aeronautics and Space Administration (NASA) | Pasadena, California | United States | 19 days ago
, and dry etching. Proficiency in thin-film characterization and metrology using SEM, AFM, and ellipsometry is required. Characterization skills must include sensitive hands-on experience with fiber