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. Investigating the etching mechanisms and selectivity of InP and InGaAlAs films as a function of plasma parameters using ellipsometry, XPS and AFM. 2. Developing an etching process for the multilayer stack meeting
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, AFM, ellipsometry, or TEM will be considered an asset. The successful candidate should also demonstrate: - strong experimental skills; - the ability to independently design and conduct experiments
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departments dedicated to research in condensed matter physics and chemistry. Its multidisciplinary character is reflected in activities covering spin electronics, magnetism, ultrafast optics, electron
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condensed matter surfaces and interfaces using X-ray reflectivity (XRR), grazing-incidence wide- and small-angle scattering (GIWAXS and GISAXS), and complementary methods such as X-ray fluorescence (XRF) and
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to embed its reflection in a contemporary context that appears to contradict its very project. Indeed, characterized as an era of loss of common values and the foundations of living together—an anxious
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empirical analyses (task 21) - Contribution to WP5: Theoretical and practical outputs • Contribution to the theoretical outputs: creation of a theoretical model that reflects private judicial, legal and
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forms of heritage knowledge production; and to contribute to a reflection on institutions as living environments, committed to an ethic of care and transmission. Roles and activities: 1. Research