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of refractory and other high temperature alloys. Key activities include materials processing, microstructural characterization using scanning electron microscopy and electron backscatter diffraction
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diffraction (EBSD), and transmission electron microscopy (TEM) for microstructural characterization of materials. Correlate irradiation conditions to the post-irradiation performance of novel materials
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using techniques such as time-of-flight secondary ion mass spectrometry (ToF-SIMS), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Experience in data reduction of big spectroscopy
Searches related to electron diffraction
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