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301.975.6523 Li-Piin Sung [email protected] 301.975.6737 Description The purpose of this research is to develop advanced characterization techniques for physical and chemical properties in the complex engineered
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Description Research opportunities are available to develop and advance measurement methods required for current and future semiconductor manufacturing processes. Areas of particular interest include
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proposals to develop, optimize and deploy a headspace collection method to measure partition coefficients at physiological temperatures. We are especially interested in methods that target molecules
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data using a multitaper spectral analysis approach [2]. The fundamental methodology around frequency stability analysis of clock data hasn’t been revisited in decades; our goal is to develop a suite of
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to the sub-nanometer scale regime. Our goal is to leverage our access to state-of-art X-ray and neutron facilities to develop and apply operando measurement methods that can quantify full three-dimensional
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to develop and test methods and reference/proficiency test materials to enhance the accuracy/reliability and uncertainty of the methods and accordingly the interpretation and application of isotope metallomics
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301.975.2338 Description This project’s focus is to develop light-scattering nanoscopy methods for rapid, multi-attribute characterization of gene therapy particles at the single particle level. Emerging gene
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their processes. Smart machine tools assess and predict their health and the performance of their processes in real time to optimize production quality and yield. Proposals are welcome to develop
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microfluidic networks.Our goal is to develop systems that enable accurate, high-throughput, and dynamic measurement of materials in flow, which will, for example, improve the ability to specify composition and
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Description We are seeking a NIST postdoctoral Fellow within the Materials Measurement Science Division . This postdoc will be a key member of a new project to develop an autonomous platform for developing and