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8 Sep 2026 Job Information Organisation/Company European Synchrotron Radiation Facility Research Field Physics Researcher Profile Established Researcher (R3) Positions Postdoc Positions Application Deadline 8 Oct 2026 - 23:59 (Europe/Paris) Country France Type of Contract Temporary Job...
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, with particular emphasis on battery science, catalysis, and the investigation of glasses and other disordered systems. The beamline’s core techniques are high-speed multidimensional X-ray diffraction and
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to optimize performances. The postdoc will carry out structural and morphological characterizations (X-ray diffraction, TOF-SIMS, AFM, and microscopy) of the selected superconducting materials. In the second
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. The postdoctoral fellow must be familiar with the standard characterization techniques used in the group (X-ray diffraction, magnetism, EPR, NMR, UV-Vis-NIR, and infrared/Raman spectroscopy). In order to design
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, electron microscopy, X-ray diffraction, etc.). Methodology: • Design and synthesize model substrates to measure the activity of enzyme mimics. • Develop analytical methods to detect and quantify chemical
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methods and experimental characterization techniques. The proposed research position will bridge the expertise of Prof. Maria Diaz Lopez’s group, specializing in X-ray diffraction and related analyses
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Chemistry, thin films, and/or NMR spectroscopy is an advantage. - Proven hands-on experience with battery characterization techniques (at least some of the following): X-ray diffraction (XRD), Raman
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Laser Doping or Pulsed Laser Induced Epitaxy, allowing the fabrication of ultra-doped Si:B layers, well above the B solubility limit in Si. The films will be characterized by X-Ray Diffraction
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FieldPhysicsYears of Research Experience1 - 4 Additional Information Eligibility criteria -The candidate should have demonstrated experience in the synthesis, characterization (X-ray diffraction (XRD
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-tube synthesis, mechanical alloying, spark plasma sintering); • Crystal structure determination and microstructural characterization (X-ray diffraction, electron microscopy, spectroscopy