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transmission electron microscopy (STEM) characterization of quantum materials and devices. The PostDoc will engage in focused ion beam (FIB) sample preparation and utilize related analytical techniques such as
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for PSCs (Nat. Energ. 2020, 5, 35-49). Indoor and Outdoor analysis of complete devices will be carried out together with data analysis and treatment. The work will be carried out at the Nanostructured
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