Sort by
Refine Your Search
-
Metrology for Quasi-Optical Wireless Probing of Monolithic Microwave Integrated Circuits NIST only participates in the February and August reviews. Ultrafast electronic devices with fundamental operating frequencies above 100 GHz are used in a wide variety of applications—examples include radio...
-
RAP opportunity at National Institute of Standards and Technology NIST Incorporating Theory and Domain Knowledge into the Machine Learning of Polymeric Systems Location Material Measurement Laboratory, Materials Science and Engineering Division opportunity location 50.64.21.C0473...
-
NIST only participates in the February and August reviews. Microsensor systems are constructed from modular components that include device platforms, sensing materials, control and signal-acquisition circuitry, and signal-processing/pattern-recognition algorithms. The sensors must be tailored...
-
RAP opportunity at National Institute of Standards and Technology NIST Durability of Concrete Materials Containing Reactive Minerals in the Aggregate and Concrete Location Engineering Laboratory, Materials and Structural Systems Division opportunity location 50.73.11.C1032 Gaithersburg,...
-
. These materials systems may have far-reaching applications, extending from neuromorphic computing to compact multiple-input multiple-output antennas. By achieving the aims of this project, this Associate will
-
Advanced Control Systems in Commercial HVAC Equipment in the Intelligent Building Agents Laboratory NIST only participates in the February and August reviews. Approximately 84% of the life cycle energy use of a building is associated with operating the building. Building owners also face...
-
catalytic turnover. Integrative modeling and machine learning have the promise of establishing new tools for combining computational and experimental data from HDX-MS and NMR to explain the dynamics and
-
of structural responses. References Wong KKF, Speicher MS: “Improved Method for the Calculation of Plastic Rotation of Moment-Resisting Framed Structures for Nonlinear Static and Dynamic Analysis”. Computational
-
RAP opportunity at National Institute of Standards and Technology NIST MEMS-Based Scanning Probe Microscopy Location Physical Measurement Laboratory, Engineering Physics Division opportunity location 50.68.31.B7380 Gaithersburg, MD NIST only participates in the February and August...
-
computational resources. Keywords Compressive sensing; Compressive sampling; Electron microscopy; Microanalysis; FIB; SEM; EDS; Imaging; Image analysis; Eligibility citizenship Open to U.S. citizens level Open to