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, Nanoscale Device Characterization Division opportunity location 50.68.03.B4752 Gaithersburg, MD 20899 NIST only participates in the February and August reviews. Advisers name email phone Christina Ann Hacker
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NIST only participates in the February and August reviews. We work in close collaboration with the electronics and ancillary industries on their long-term metrology needs. For example, emerging
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recognition; Multivariate statistics; LC-MS analysis; Computer programming; Data analysis; Chemometrics; Principal component analysis; D-partial least squares; Eligibility citizenship Open to U.S. citizens
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, forensics, statistics, and computer programming are applicable. Keywords Forensics; Forensic Science; Seized Drug; Opioids; Mass Spectrometry; Statistics; Analytical Chemistry Eligibility citizenship Open to
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RAP opportunity at National Institute of Standards and Technology NIST Computational Fluid Dynamics & Quantum Algorithms (Multiphase Systems) Location Material Measurement Laboratory, Applied
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RAP opportunity at National Institute of Standards and Technology NIST Computational and Theoretical Approaches for Understanding Complex Fluids Location Material Measurement Laboratory
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and Techniques 59(1): 188, 2011 Database; Microelectronics; Machine learning; Data informatics; Physics; Terahertz; Metrology;
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opportunity location 50.77.51.B7525 Gaithersburg, MD NIST only participates in the February and August reviews. Advisers name email phone Ram D. Sriram [email protected] 301.975.3507 Description The future health
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; Microelectronics; Machine learning; Data informatics; Physics; Terahertz; Metrology; Chemistry; Materials engineering;
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Measurement Science Division opportunity location 50.64.31.C0724 Gaithersburg, MD NIST only participates in the February and August reviews. Advisers name email phone Mark McLean [email protected]