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, with applications ranging from scientific research to medical imaging and marketing analysis. With the ever increasing amount of learning data, these algorithms face computational challenges
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Intelligence (AI) algorithms, including Machine Learning (ML) and Deep Learning (DL) techniques, for advanced signal analysis. The work will focus on developing methodologies for the detection, extraction
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learning-assisted computational pipeline for the automated detection of point defects in atomic-resolution scanning transmission electron microscopy (STEM) images. Using monolayer MoS₂ as a model system, the
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