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transport properties. In detail you will: Utilize a unique nanoprobing tool with SEM, AFM and STM capabilities to study samples provided by IMEC to measure the nanoscale charge transport properties on
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these with advanced surface metrology. It is relevant to have experience with analysis techniques such as AFM, WLI, contact-angle, XPS, infrared metrology. You will work in the XUV Optics group at the
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research will combine membrane synthesis (polymeric and composite systems, thin films, self-assembly approaches) with advanced characterization techniques such as AFM/KPFM, XPS, SEM/EDS, and transport
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, AFM/KPFM, electrical characterization, nanostructuration, and nanocalorimetry. Main Tasks and responsibilities: Grow and optimize vapor-deposited molecular-glass thin films. Characterize
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metrology is based on state-of-the-art broadband AFM near field imaging systems with modifications allowing nanoscale measurement and control of electromagnetic properties. 1. Berweger S
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, ALD, etc), and lithography (E-Beam, UV, and DUV) Characterization including: Ellipsometry, SEM, AFM, PL, etc. For the Packaging engineer: Advanced dicing techniques, including edge polishing Chip
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interconnects characterise the results (SEM, AFM, XCT, optical microscopy) for geometric accuracy, durability and interfacial strength -validate scalability and sustainability: less material waste
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Prof. A.-S. Duwez, in the framework of the ERC Advanced Grant project ChemForce ( https://cordis.europa.eu/project/id/101054338 ). Starting date: between November 1st and January 1st We are looking
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femtosecond or picosecond laser micro-drilling and selective metallisation for high-aspect-ratio vertical interconnects characterise the results (SEM, AFM, XCT, optical microscopy) for geometric accuracy
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details Expiration : 2027-08-31 [YYYY-MM-DD] Description of the offer : You will join the Spin Team - https://spin.ijl.cnrs.fr/- a leading team in spintronics and nanomagnetism and will participate in