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Department of Chemical Engineering at the University of Bath, UK: https://www.bath.ac.uk/campaigns/membranes-research-expertise/ About you You should have a PhD in Chemical Engineering, Environmental
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. The Research Environment The position is hosted jointly by the CoSAXS beamline and the Edler goup at Lund University. CoSAXS ( https://www.maxiv.lu.se/beamlines-accelerators/beamlines/cosaxs/ ) is a
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with specific characterization or processing techniques mentioned in the position (e.g., electron/optical microscopy, spectroscopy, AFM, plasma processing, thin-film deposition, mechanical testing of
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measurements in the UV-Vis-NIR range (knowledge of time-resolved spectroscopy will be an additional asset); • Expertise in the study of morphology and structure of thin organic layers (AFM and scanning
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stipulated in the resource allocation (staff effort) section of Annex 1 of the Grant Agreement. Where to apply Website https://sede.udc.gal/services/electronic_board/EXP2026/008881 Requirements Research
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Luxembourg Institute of Science and Technology (LIST) | Esches, Picardie | France | about 17 hours ago
and applied research to design solutions that address real-world challenges and create positive impact. Do you want to know more about LIST? Check our website: https://www.list.lu/ How will you
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Luxembourg Institute of Science and Technology (LIST) | Esches, Picardie | France | about 17 hours ago
and applied research to design solutions that address real-world challenges and create positive impact. Do you want to know more about LIST? Check our website: https://www.list.lu/ How will you
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synthesis and click chemistry. Use broad advanced instrumentation for X-ray/neutron scattering studies, surface studies (QCM-D, AFM), analytics (SEC-MALS/A4F) as well as spectroscopy (NMR/fluorescence
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experience with a range of advanced characterisation and experimental approaches, including Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM), Confocal Laser Scanning Microscopy (CLSM
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advanced characterisation and experimental approaches, including Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM), Confocal Laser Scanning Microscopy (CLSM), phase-enhanced synchrotron X