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methods to image complex wafer metrology targets and to improve the precision of modern methods of alignment and overlay metrology for the semiconductor industry. As a Postdoctoral Researcher, you will play
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for the semiconductor industry. While the academic setting and research style are geared towards establishing scientific excellence, the topics in ARCNL’s research program are intimately connected with the interests
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media. The new approach will enable imaging and accurate characterization of nanostructures for the semiconductor industry. Optical metrology is a key ingredient of nanolithography, as it enables
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improve the precision of modern methods of alignment and overlay metrology for the semiconductor industry. As a Postdoctoral Researcher, you will play a pivotal role in our cutting-edge research efforts
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), the Vrije Universiteit (VU) Amsterdam and the semiconductor equipment manufacturer ASML. ARCNL is located at the Science Park Amsterdam, The Netherlands (see also www.arcnl.nl ). The research activities