2 postdoctoral positions at ARCNL in the-netherlands

Postdoc: Machine learning for imaging and metrology

methods to image complex wafer metrology targets and to improve the precision of modern methods of alignment and overlay metrology for the semiconductor industry. As a Postdoctoral Researcher, you will play

Postdoc: Machine learning for imaging and metrology

improve the precision of modern methods of alignment and overlay metrology for the semiconductor industry. As a Postdoctoral Researcher, you will play a pivotal role in our cutting-edge research efforts